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IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS). Founded as a classical spin-off of the University of Munster, IONTOF has meanwhile become the technological leader in the field of TOF-SIMS and LEIS instrumentation. The company was founded by Prof. Alfred Benninghoven, Dr. Ewald Niehuis and Mr. Thomas Heller in 1989 to commercialise the original research carried out by Prof. Benninghoven and his team at the University of Muenster in Germany from the early 80s. Since the technique became commercially viable IONTOF...
Surface analysis,ion beam technology,tof-sims,leis,msi,mass spectrometry imaging,secondary ion mass spectrometry,low energy ion scattering,and sims
Iontof operates in the Nanotechnology research industry.
Iontof's revenue is 11m - 100m
Iontof has 11 - 50 employees.
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