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Squeeze info from every photon! Control micro- to nano-scale device fabrication like the worlds leaders - using state-of the art optical metrology systems from n&k Technology. In-line metrology for high-volume manufacturing (HVM) of discrete and integrated circuit (IC) semiconductors, CMOS Image Sensors, MEMS, photomasks, hard-disk drives, solar cells, and flat panel displays. Thickness systems quantify n- and k-spectra, and band-gaps of ultra-thin to ultra-thick multi-layer deposited stacks, and of epi-silicon, SOI, and GaN-on-Si. Scatterometer systems for Optical Critical Dimension (OCD) control of small- to large-pitch complex patterns including deep trenches, contact holes, and high aspect-ratio 3D structures in advanced devices....
Semiconductor manufacturing,optical metrology,process control,wafer fab,original equipment manufacturer,physics,flat panel display,mems,power chip,silicon,silicon carbide,gallium nitride,yield,thin film,n&k,index of refraction,extinction coefficient,optical critical dimension,ocd,and global support
N&k technology operates in the Semiconductors industry.
N&k technology's revenue is 11m - 100m
N&k technology has 11 - 50 employees.
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